Optical processing by scanning near-field optical/atomic force microscopy

By Nakajima K.   Muramastu H.   Chiba N.   Ataka T.   Fujihira M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 327-330

Elsevier

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Scanning near-field optic/atomic force microscopy in liquids

By Muramatsu H.   Chiba N.   Homma K.   Nakajima K.   Ataka T.   Ohta S.   Kusumi A.   Fujihira M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 335-338

Elsevier

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Design and application of scanning near-field optical/atomic force microscopy

By Ataka T.   Muramatsu H.   Nakajima K.   Chiba N.   Homma K.   Fujihara M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 154-160

Elsevier

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Application of phase contrast imaging atomic force microscopy to tribofilms on DLC coatings

By Ahn H.-S.   Chizhik S.A.   Dubravin A.M.   Kazachenko V.P.   Popov V.V.  

Wear, Vol. 249, Iss. 7, 2001-07 ,pp. : 617-625

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Contact and non-contact mode imaging by atomic force microscopy

By Morita S.   Fujisawa S.   Kishi E.   Ohta M.   Ueyama H.   Sugawara Y.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 138-142

Elsevier

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