Total ionizing dose effects on a radiation-induced BiMOS analog-to-digital converter

Author: Xue Wu   Wu Lu   Yiyuan Wang   Jialing Xu   Leqing Zhang   Jian Lu   Xin Yu   Xingyao Zhang   Tianle Hu  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.34, Iss.1, 2013-01, pp. : 15006-15011

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Abstract