Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

By Sobchenko I.  

Philosophical Magazine, Vol. 87, Iss. 16-17, 2007-01 ,pp. : 2427-2460

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Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

By Sobchenko I.  

Philosophical Magazine, Vol. 87, Iss. 17, 2007-01 ,pp. : 2427-2460

Taylor & Francis Ltd

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AFM investigations of a sample showing the B 2 phase

By Hauser A.   Schmalfuss H.   Kresse H.  

Liquid Crystals, Vol. 27, Iss. 5, 2000-05 ,pp. : 629-634

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Characterization of the B 4 phase by dielectric and AFM measurements

By Kresse H.   Salfetnikova J.   Nadasi H.   Weissflog W.   Hauser A.  

Liquid Crystals, Vol. 28, Iss. 7, 2001-07 ,pp. : 1017-1023

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Experimental studies on the B 7 phase of a banana-shaped achiral mesogen

By Rao D.S.S.   Nair G. G.   Prasad S.K.   Nagamani S.A.   Yelamaggad C. V.  

Liquid Crystals, Vol. 28, Iss. 8, 2001-08 ,pp. : 1239-1243

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