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By Sobchenko I.  

Philosophical Magazine, Vol. 87, Iss. 16-17, 2007-01 ,pp. : 2427-2460

Taylor & Francis Ltd

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Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

By Lagerpusch Ulrike   Anczykowski Boris   Nembach Eckhard  

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Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

By Fruhstorfer B.   Mohles V.   Reichelt R.   Nembach E.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 13, 2002-09 ,pp. : 2575-2589

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In-situ atomic force microscopy and transmission electron microscopy observations of the deformation of MC2 nickel-based superalloy gamma phase

By Coupeau C.   Brochard S.   Jouiad M.   Coujou A.   Grilhe J.  

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Scanning transmission electron microscopy (STEM)-transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel

By Aggarwal S.   Goodhew P.J.   Murray R.T.  

Thin Solid Films, Vol. 446, Iss. 1, 2004-01 ,pp. : 12-17

Elsevier

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