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Taylor & Francis Ltd

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Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

By Lagerpusch Ulrike   Anczykowski Boris   Nembach Eckhard  

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Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

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In-situ atomic force microscopy and transmission electron microscopy observations of the deformation of MC2 nickel-based superalloy gamma phase

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Scanning transmission electron microscopy (STEM)-transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel

By Aggarwal S.   Goodhew P.J.   Murray R.T.  

Thin Solid Films, Vol. 446, Iss. 1, 2004-01 ,pp. : 12-17

Elsevier

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