Dislocations in nanocrystalline SnO2 thin films

Author: Zheng J. G.   Pan X.   Schweizer M.   Weimar U.   Gopel W.   Ruhle M.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.73, Iss.3, 1996-03, pp. : 93-100

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Abstract