Structural properties of microcrystalline silicon-germanium films

Author: Houben L.   Carius R.   Lundszien D.   Folsch J.   Finger F.   Luysberg M.   Wagner H.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.79, Iss.2, 1999-02, pp. : 71-78

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Abstract