Defect formation of Au thin films on SiO2/Si upon annealing

Author： Chan Lim D.   Lopez-Salido I.   Dietsche R.   Dok Kim Y.  

Publisher： Taylor & Francis Ltd

ISSN： 1478-6443

Source： Philosophical Magazine, Vol.85, Iss.29, 2005-10, pp. : 3477-3486

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Band alignment and defect states in amorphous GaInZnO thin films grown on SiO2/Si substrates

By  

SURFACE AND INTERFACE ANALYSIS, Vol. 48, Iss. 10, 2016-10 ,pp. : 1062-1065

John Wiley & Sons Inc

Access to resources Recommend Favorite

Defect-related photoluminescence and Raman studies on the growth of Ge nanocrystals during annealing of Ge + -implanted SiO 2 films

By Choi S.-h.   Han S.-c.   Hwang S.  

Thin Solid Films, Vol. 413, Iss. 1, 2002-06 ,pp. : 177-180

Elsevier

Access to resources Recommend Favorite

Study on annealing effects of Au thin films on Si

By Young T.F.   Chang J.F.   Ueng H.Y.  

Thin Solid Films, Vol. 322, Iss. 1, 1998-06 ,pp. : 319-322

Elsevier

Access to resources Recommend Favorite

Formation of nanometer-scale structures in SiO2 thin films by means of MeV-ion irradiation

By Cheang-Wong Juan-Carlos  

Radiation Effects and Defects in Solids, Vol. 162, Iss. 3-4, 2007-03 ,pp. : 247-258

Taylor & Francis Ltd

Access to resources Recommend Favorite

ANNEALING INDUCED DEGRADATION OF THERMAL SiO2 ON (1 0 0)Si: POINT DEFECT GENERATION

By STESMANS A.   PIERREUX D.   AFANAS'EV V. V.  

Radiation Effects and Defects in Solids, Vol. 158, Iss. 1-6, 2003-01 ,pp. : 419-425

Taylor & Francis Ltd

Access to resources Recommend Favorite