New 1/1 cubic approximant phases in the Al-Cu-Ru-Si system studied by electron diffraction and high-resolution electron microscopy

By Saito K.   Sugiyama K.   Hiraga K.  

Philosophical Magazine Letters, Vol. 80, Iss. 2, 2000-02 ,pp. : 73-78

Taylor & Francis Ltd

Access to resources Recommend Favorite

Electron microscopy analysis of decagonal quasicrystals in the Al-Cu-Co-Si system

By Mukhopadhyay N. K.   Sastry G. V. S.   Weatherly G. C.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 80, Iss. 8, 2000-08 ,pp. : 1795-1809

Taylor & Francis Ltd

Access to resources Recommend Favorite

In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si(001) heterostructures

By Stach E. A.   Hull R.   Tromp R. M.   Ross F. M.   Reuter M. C.   Bean J. C.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 80, Iss. 9, 2000-09 ,pp. : 2159-2200

Taylor & Francis Ltd

Access to resources Recommend Favorite

Transmission electron microscopy of Al-Cu interconnects during in-situ electromigration testing

By Shih W.C.   Greer A.L.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 103-117

Elsevier

Access to resources Recommend Favorite

Crystallization of amorphous Si 0.5 Ge 0.5 films studied by means of in-situ X-ray diffraction and in-situ transmission electron microscopy

By Edelman F.   Raz T.   Komem Y.   Zaumseil P.   Osten H. -J.   Capitan M.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 11, 1999-11 ,pp. : 2617-2628

Taylor & Francis Ltd

Access to resources Recommend Favorite