X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a -plane sapphire by metalorganic vapour phase epitaxy

By Martínez-Tomás M.C.   Zúñiga-Pérez J.   Vennéguès P.   Tottereau O.   Muñoz-Sanjosé V.  

Applied Physics A, Vol. 88, Iss. 1, 2007-07 ,pp. : 61-64

Springer Publishing Company

Access to resources Recommend Favorite

Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy

By  

CRYSTAL RESEARCH AND TECHNOLOGY (ELECTRONIC), Vol. 50, Iss. 1, 2015-01 ,pp. : 38-42

John Wiley & Sons Inc

Access to resources Recommend Favorite

Study on the structure of Fe 16 N 2 single-crystal films by transmission electron microscopy

By Sun D.C.   Jiang E.Y.   Sun D.  

Thin Solid Films, Vol. 298, Iss. 1, 1997-04 ,pp. : 116-121

Elsevier

Access to resources Recommend Favorite

Transmission electron microscopy study of epitaxial lanthanum-manganite thin films on SrTiO3

By Han K.   Yu-Zhang K.  

Philosophical Magazine B, Vol. 79, Iss. 6, 1999-06 ,pp. : 897-909

Taylor & Francis Ltd

Access to resources Recommend Favorite

Physical vapour deposition growth and transmission electron microscopy characterization of epitaxial thin metal films on single-crystal Si and Ge substrates

By Westmacott K. H.   Hinderberger S.   Dahmen U.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 6, 2001-06 ,pp. : 1547-1578

Taylor & Francis Ltd

Access to resources Recommend Favorite