Development of a new 3 MV ultra-high voltage electron microscope at Osaka University

By Takaoka A.  

Journal of Electron Microscopy, Vol. 46, Iss. 6, 1998-01 ,pp. : 447-456

Oxford University Press

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High-pressure freezing is a powerful tool for visualization of Schizosaccharomyces pombe cells: ultra-low temperature and low-voltage scanning electron microscopy and immunoelectron microscopy

By Osumi Masako   Konomi Mami   Sugawara Tomoko   Takagi Tomoko   Baba Misuzu  

Journal of Electron Microscopy, Vol. 55, Iss. 2, 2006-04 ,pp. : 75-88

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system

By Wang Zhouguang   Kato Takeharu   Hirayama Tsukasa  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 489-491

Oxford University Press

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Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperatures

By Kamino Takeo   Yaguchi Toshie   Sato Takahiro   Hashimoto Takahito  

Journal of Electron Microscopy, Vol. 54, Iss. 6, 2005-12 ,pp. : 505-508

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