Effects of oxygen partial pressure on the microstructure and electrical properties of indium tin oxide film prepared by d.c. magnetron sputtering

Author: Choi C.G.   No K.   Lee W.-J.   Kim H.-G.   Jung S.O.   Lee W.J.   Kim W.S.   Yoon C.   Kim S.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.258, Iss.1, 1995-03, pp. : 274-278

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Abstract