The aging effect on SnO 2 -Au thin film sensors: electrical and structural characterization

By Nelli P.   Faglia G.   Sberveglieri G.   Cereda E.   Gabetta G.   Dieguez A.   Romano-Rodriguez A.   Morante J.R.  

Thin Solid Films, Vol. 371, Iss. 1, 2000-08 ,pp. : 249-253

Elsevier

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High-temperature-annealing effects on the electrical properties of RF sputtered SnO 2 thin films for microelectronic sensors

By Andreev S.K.   Popova L.I.   Gueorguiev V.K.   Manolov E.B.  

Vacuum, Vol. 47, Iss. 11, 1996-11 ,pp. : 1325-1328

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Formation of a crystalline metal-rich silicide in thin film titanium/silicon reactions

By Clevenger L.A.   Cabral C.J.   Roy R.A.   Lavoie C.   Jordan-Sweet J.   Brauer S.   Stephenson G.B.   Morales G.   Ludwig K.F.J.  

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 220-226

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Silicide formation in thin film Pt-Si(111) structure by USXES data

By Domashevskaya E.P.   Yurakov Y.A.   Kashkarov V.M.  

Thin Solid Films, Vol. 298, Iss. 1, 1997-04 ,pp. : 135-137

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Resistance calculations for thin film rectangles

By Hall P.M.  

Thin Solid Films, Vol. 300, Iss. 1, 1997-05 ,pp. : 256-264

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