Annealing effects on a-SiC:H and a-SiC:H(F) thin films deposited by PECVD at room temperature

Author: Lee Y.H.   Kim D.S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.261, Iss.1, 1995-06, pp. : 192-201

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract