Strain relaxation in ultrathin epitaxial films of -FeSi 2 on unstrained and strained Si(100) surfaces

Author: Peale D.R.   Haight R.   Legoues F.K.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.264, Iss.1, 1995-08, pp. : 28-39

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract