Application of neural networks to a scanning probe microscopy system

Author: Hadjiiski L.   Linnemann R.   Stopka M.   Oesterschulze E.   Rangelow I.   Kassing R.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.264, Iss.2, 1995-08, pp. : 291-297

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Abstract