X-ray reflectivity study on TiN/Ti/Si structures before and after annealing

By Santucci S.   Giuliani P.   Picozzi P.   Phani A.R.   De Biase M.   Alfonsetti R.   Moccia G.   Missori M.  

Thin Solid Films, Vol. 360, Iss. 1, 2000-02 ,pp. : 89-95

Elsevier

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X-ray reflectivity analysis of thin TiN and TiO x N y films deposited by dual-ion-beam sputtering on (100)Si substrates

By Alvisi M.   Rizzo A.   Tapfer L.   Vasanelli L.  

Thin Solid Films, Vol. 298, Iss. 1, 1997-04 ,pp. : 130-134

Elsevier

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Heteroepitaxial growth of La 0.7 Ca 0.3 MnO 3 /SrTiO 3 /TiN/Si by pulsed laser deposition

By Wong K.H.   Leung Y.S.  

Thin Solid Films, Vol. 354, Iss. 1, 1999-10 ,pp. : 55-58

Elsevier

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Structural change of TiN/Ti/SiO 2 multilayers by N 2 annealing

By Hamamura H.   Itoh H.   Shimogaki Y.   Aoyama J.   Yoshimi T.   Ueda J.   Komiyama H.  

Thin Solid Films, Vol. 320, Iss. 1, 1998-05 ,pp. : 31-34

Elsevier

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An X-ray diffraction study of epitaxial TiN/NbN superlattices

By Madan A.   Yashar P.   Shinn M.   Barnett S.A.  

Thin Solid Films, Vol. 302, Iss. 1, 1997-06 ,pp. : 147-154

Elsevier

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