Temperature dependence of radiative and non-radiative transitions in porous silicon

By Tsuboi T.   Laiho R.   Pavlov A.  

Thin Solid Films, Vol. 255, Iss. 1, 1995-01 ,pp. : 216-218

Elsevier

Access to resources Recommend Favorite

Investigation of different oxidation processes for porous silicon studied by spectroscopic ellipsometry

By Frotscher U.   Rossow U.   Ebert M.   Pietryga C.   Richter W.   Munder H.   Arens-Fischer R.   Berger M.G.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 36-39

Elsevier

Access to resources Recommend Favorite

Photoluminescence characterization of non-radiative defect density on silicon surfaces and interfaces at room temperature

By Timoshenko V.Y.   Petrenko A.B.   Dittrich T.   Fussel W.   Rappich J.  

Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. : 196-199

Elsevier

Access to resources Recommend Favorite

Acoustic microscopy investigation of porous silicon

By Da Fonseca R.J.M.   Saurel J.M.   Foucaran A.   Massone E.   Taliercio T.   Camassel J.  

Thin Solid Films, Vol. 255, Iss. 1, 1995-01 ,pp. : 155-158

Elsevier

Access to resources Recommend Favorite

Near-field optical investigation of porous silicon samples

By Allegrini M.   Fuso F.   Labardi M.   Pardi L.   Sbrana F.   Mulloni V.   Mazzoleni C.   Chierchia R.   Pavesi L.  

Philosophical Magazine B, Vol. 80, Iss. 4, 2000-04 ,pp. : 611-621

Taylor & Francis Ltd

Access to resources Recommend Favorite