Structural properties of Ge nano-crystals embedded in SiO 2 films from X-ray diffraction and Raman spectroscopy

By Rolo A.G.   Vasilevskiy M.I.   Conde O.   Gomes M.J.M.  

Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. : 58-62

Elsevier

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Mechanism of photo-stimulated processes in GeO x films

By Nazarenkov F.A.   Sterligov V.A.  

Thin Solid Films, Vol. 254, Iss. 1, 1995-01 ,pp. : 164-168

Elsevier

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Synthesis of Ge nanocrystals in thermal SiO 2 films by Ge + ion implantation

By Zhang J.-Y.   Bao X.-M.   Ye Y.-H.  

Thin Solid Films, Vol. 323, Iss. 1, 1998-06 ,pp. : 68-71

Elsevier

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Defect-related photoluminescence and Raman studies on the growth of Ge nanocrystals during annealing of Ge + -implanted SiO 2 films

By Choi S.-h.   Han S.-c.   Hwang S.  

Thin Solid Films, Vol. 413, Iss. 1, 2002-06 ,pp. : 177-180

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Raman scattering studies of amorphous Si x Ge 1 - x :H alloy films produced by hot-filament assisted chemical vapour deposition technique

By Kumbhar A.A.   Kshirsagar S.T.  

Thin Solid Films, Vol. 302, Iss. 1, 1997-06 ,pp. : 102-107

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