TEM observation of structural differences between two types of Ni silicide/Si thin films caused by FIB irradiation

By Tanaka M.   Furuya K.   Saito T.  

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 101-105

Elsevier

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TEM investigation of the dependence of structural defects on prelayer formation in GaAs-on-Si thin films

By Lioutas C.B.   Delimitisi A.   Georgakilas A.  

Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. : 96-99

Elsevier

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Formation of Co and Ta silicides on Si(111) and Si(100) substrates from codeposited Co and Ta thin films

By Pelleg J.  

Thin Solid Films, Vol. 325, Iss. 1, 1998-07 ,pp. : 60-71

Elsevier

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Formation of a crystalline metal-rich silicide in thin film titanium/silicon reactions

By Clevenger L.A.   Cabral C.J.   Roy R.A.   Lavoie C.   Jordan-Sweet J.   Brauer S.   Stephenson G.B.   Morales G.   Ludwig K.F.J.  

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 220-226

Elsevier

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Silicide formation in thin film Pt-Si(111) structure by USXES data

By Domashevskaya E.P.   Yurakov Y.A.   Kashkarov V.M.  

Thin Solid Films, Vol. 298, Iss. 1, 1997-04 ,pp. : 135-137

Elsevier

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