Effects of r.f. bias and nitrogen flow rates on the reactive sputtering of TiAlN films

Author: Shew B.-Y.   Huang J.-L.   Lii D.-F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.293, Iss.1, 1997-01, pp. : 212-219

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Abstract