Si 1-x Ge x /Si valence band offset determination using current-voltage characteristics

Author: Chretien O.   Apetz R.   Vescan L.   Souifi A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 198-200

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Abstract