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By Fang T.-H.   Weng C.-I.   Chang J.-G.   Hwang C.-C.  

Thin Solid Films, Vol. 396, Iss. 1, 2001-09 ,pp. : 167-173

Elsevier

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Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

By Fruhstorfer B.   Mohles V.   Reichelt R.   Nembach E.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 13, 2002-09 ,pp. : 2575-2589

Taylor & Francis Ltd

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Morphology of protein polymer hybrid films studied by atomic force microscopy and scanning confocal fluorescence microscopy

By Foubert P.   Hannink J.M.   Kohn F.   Gronheid R.   Sommerdijk N.A.J.M.   Nolte R.J.M.   De Feyter S.   De Schryver F.C.  

Thin Solid Films, Vol. 443, Iss. 1, 2003-10 ,pp. : 124-135

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Micro/nanotribology of ultra-thin hard amorphous carbon coatings using atomic force/friction force microscopy

By Sundararajan S.   Bhushan B.  

Wear, Vol. 225, Iss. 1, 1999-04 ,pp. : 678-689

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Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

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Philosophical Magazine, Vol. 87, Iss. 16-17, 2007-01 ,pp. : 2427-2460

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