InP monolayers inserted in a GaP matrix studied by spectroscopic ellipsometry

Author: Schmidt H.   Rheinlander B.   Gottschalch V.   Wagner G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.312, Iss.1, 1998-01, pp. : 354-356

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Abstract