Characterization of different porous silicon structures by spectroscopic ellipsometry

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Elsevier

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InP monolayers inserted in a GaP matrix studied by spectroscopic ellipsometry

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In situ monitoring of ZnS/GaP and ZnSe/GaAs metalorganic vapor phase epitaxy using reflectance anisotropy spectroscopy and spectroscopic ellipsometry

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Investigation of thin Al layer growth with in situ infrared spectroscopic ellipsometry

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Structural Control of Rashba Spin–Orbit Coupling in In 0.52 Al 0.48 As/In 0.53 Ga 0.47 As/In 0.52 Al 0.48 As Quantum Wells

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