Growth and properties of W-Si-N diffusion barriers deposited by chemical vapor deposition

Author: Fleming J.G.   Roherty-Osmun E.   Smith P.M.   Custer J.S.   Kim Y.-D.   Kacsich T.   Nicolet M.-A.   Galewski C.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.320, Iss.1, 1998-05, pp. : 10-14

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content