Grazing incidence X-ray diffraction analysis of alkali fluoride thin films for optical devices

Author： Cremona M. Mauricio M.H.P. Fehlberg L.V. Nunes R.A. Scavarda do Carmo L.C. de Avillez R.R. Caride A.O.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.333, Iss.1, 1998-11, pp. : 157-164

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