Author： Simonsen A.C. Schleberger M. Tougaard S. Hansen J.L. Larsen A.N.
Publisher： Elsevier
ISSN： 0040-6090
Source： Thin Solid Films, Vol.338, Iss.1, 1999-01, pp. : 165-171
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
STM study of step graded Si 1-x Ge x /Si(001) buffers
By Kummer M. Vogeli B. Von Kanel H.
Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. :
AFM and XPS study of nitrided TiO 2 and SiO 2 -TiO 2 sol-gel derived films
By Wicikowski L. Kusz B. Murawski L. Szaniawska K. Susla B.
Vacuum, Vol. 54, Iss. 1, 1999-07 ,pp. :
Morphology and photoluminescence of Ge islands grown on Si(001)
By Goryll M. Vescan L. Luth H.
Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. :