Ellipsometric studies of porous silicon

Author: Makara V.A.   Odarych V.A.   Vakulenko O.V.   Dacenko O.I.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.342, Iss.1, 1999-03, pp. : 230-237

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Abstract