Author: Wakayama Y. Tagami T. Tanaka S.-i.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.350, Iss.1, 1999-08, pp. : 300-307
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Ge-induced enhancement of solid-phase crystallization of Si on SiO 2
By Yamaguchi S. Park S.-k. Sugii N. Nakagawa K. Miyao M.
Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. :
Alignment of Ge three-dimensional islands on faceted Si(001) surfaces
By Sakamoto K. Matsuhata H. Tanner M.O. Wang D. Wang K.L.
Thin Solid Films, Vol. 321, Iss. 1, 1998-05 ,pp. :