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Elsevier

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Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry

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Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

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Contribution of the fluorescence to conversion electron yield X-ray absorption fine-structure measurements

By Proux O.   Mimault J.   Girardeau T.  

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Texture and secondary extinction measurements in Al\Ti stratified films by X-ray diffraction

By Tomov I.   Adamik M.   Barna P.B.   Yamakov V.  

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