Optical characterization of thermally oxidized Si 1-x-y Ge x C y layers

Author: Cuadras A.   Garrido B.   Bonafos C.   Morante J.R.   Fonseca L.   Franz M.   Pressel K.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.364, Iss.1, 2000-03, pp. : 233-238

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Abstract