Defect-free strain relaxation in locally MBE-grown SiGe heterostructures

By Eisele I.   Rupp T.   Kaesen F.   Hansch W.   Hammerl E.   Gravesteijn D.J.   Schorer R.   Silveira E.   Abstreiter G.  

Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. : 27-32

Elsevier

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Morphology and photoluminescence of Ge islands grown on Si(001)

By Goryll M.   Vescan L.   Luth H.  

Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. : 244-247

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Defect-related photoluminescence and Raman studies on the growth of Ge nanocrystals during annealing of Ge + -implanted SiO 2 films

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Thin Solid Films, Vol. 413, Iss. 1, 2002-06 ,pp. : 177-180

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Optical and structural characterization of Si/SiGe heterostructures grown by RTCVD

By Sidiki T.   Christiansen S.H.   Chabert S.   de Boer W.B.   Ferrari C.   Strunk H.P.   Sotomayor Torres C.M.  

Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. : 431-435

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Time-resolved dislocation-related luminescence in strain-relaxed SiGe/Si

By Fukatsu S.   Mera Y.   Inoue M.   Maeda K.  

Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. : 33-36

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