Imaging wurtzite GaN surfaces by molecular beam epitaxy-scanning tunneling microscopy

Author: Xue Q.K.   Xue Q.Z.   Kuwano S.   Sakurai T.   Ohno T.   Tsong I.S.T.   Qiu X.G.   Segawa Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.367, Iss.1, 2000-05, pp. : 149-158

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Abstract