Structural and optical properties of Si/Si 1-x Ge x wires

Author: Zhuang Y.   Schelling C.   Stangl J.   Penn C.   Senz S.   Schaffler F.   Roch T.   Daniel A.   Grenzer J.   Pietsch U.   Bauer G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.369, Iss.1, 2000-07, pp. : 409-413

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Abstract