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Thin Solid Films, Vol. 416, Iss. 1, 2002-09 ,pp. : 49-53

Elsevier

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Characterization of linearly graded metamorphic InGaP buffer layers on GaAs using high-resolution X-ray diffraction

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Characterization of Ga 1− x Mn x As/(001)GaAs epilayers grown by low-temperature molecular beam epitaxy

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Optical nonlinear properties of Cd 1-x Zn x Te epilayers grown on (100) GaAs by pulsed laser deposition

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