Proton channeling into the Si substrate at the bottom of ultrahigh-aspect-ratio contact holes during plasma etching

Author: Ichimori T.   Ikegami N.   Hirashita N.   Kanamori J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.374, Iss.2, 2000-10, pp. : 228-234

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Abstract