Difference between C 4 F 8 and C 5 F 8 plasmas in surface reaction processes for selective etching of SiO 2 over Si 3 N 4

Author: Motomura H.   Imai S.-i.   Tachibana K.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.374, Iss.2, 2000-10, pp. : 243-248

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Abstract