Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry

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Elsevier

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Soft X-ray fluorescence measurements of polyimide films

By Winarski R.P.   Ederer D.L.   Kurmaev E.Z.   Shamin S.N.   Endo K.   Ida T.   Moewes A.   Chang G.S.   Kim S.Y.   Whang C.N.  

Thin Solid Films, Vol. 357, Iss. 2, 1999-12 ,pp. : 91-97

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Measurements of hard x-ray emission from runaway electrons in DIII-D

By James A.N.   Austin M.E.   Commaux N.   Eidietis N.W.   Evans T.E.   Hollmann E.M.   Humphreys D.A.   Hyatt A.W.   Izzo V.A.   Jernigan T.C.   Haye R.J. La   Parks P.B.   Strait E.J.   Tynan G.R.   Wesley J.C.   Yu J.H.  

Nuclear Fusion, Vol. 52, Iss. 1, 2012-01 ,pp. : 13007-13019

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X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

By Benoist L.   Gonbeau D.   Pfister-Guillouzo G.   Schmidt E.   Meunier G.   Levasseur A.  

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Structural characterization of Langmuir-Blodgett films by X-ray diffraction in transmission geometry

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