Studies on Ge/CeO 2 thin film system using positron beam and Raman spectroscopy

Author： Venugopal Rao G.   Amarendra G.   Viswanathan B.   Kanakaraju S.   Balaji S.   Mohan S.   Sood A.K.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.406, Iss.1, 2002-03, pp. : 250-254

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