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Thin Solid Films, Vol. 256, Iss. 1, 1995-02 ,pp. : 59-63

Elsevier

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An X-ray diffraction (XRD) study of vapor deposited gold thin films on aluminum nitride (AlN) substrates

By Dutta I.   Munns C.B.   Dutta G.  

Thin Solid Films, Vol. 304, Iss. 1, 1997-07 ,pp. : 229-238

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Correlation of Raman and X-ray diffraction measurements of annealed pulsed laser deposited ZnO thin films

By Roy C.   Byrne S.   McGlynn E.   Mosnier J.-P.   de Posada E.   O'Mahony D.   Lunney J.G.   Henry M.O.   Ryan B.   Cafolla A.A.  

Thin Solid Films, Vol. 436, Iss. 2, 2003-07 ,pp. : 273-276

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Characterisation of ZnS:Mn thin films by Rietveld refinement of Bragg-Brentano X-ray diffraction patterns

By Tagliente M.A.   Penza M.   Gusso M.   Quirini A.  

Thin Solid Films, Vol. 353, Iss. 1, 1999-09 ,pp. : 129-136

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Stress in hydrogenated amorphous silicon determined by X-ray diffraction

By Harting M.   Woodford S.   Knoesen D.   Bucher R.   Britton D.T.  

Thin Solid Films, Vol. 430, Iss. 1, 2003-04 ,pp. : 153-156

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