Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO 2 films

Author: Lavcevic M.L.   Turkovic A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.419, Iss.1, 2002-11, pp. : 105-113

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract