2 MeV proton channeling contrast microscopy of LEO GaN thin film structures

Author： Osipowicz T.   Teo E.J.   Bettiol A.A.   Watt F.   Hao M.S.   Chua S.J.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.424, Iss.1, 2003-01, pp. : 139-142

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