Author: Malhaire C. Barbier D.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.427, Iss.1, 2003-03, pp. : 362-366
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Ellipsometric analysis of polysilicon layers
By Gruska B.
Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. :
Polysilicon micromachined fiber-optical attenuator for DWDM applications
By Zhang X.M. Liu A.Q. Lu C. Wang F. Liu Z.S.
Sensors and Actuators A: Physical, Vol. 108, Iss. 1, 2003-11 ,pp. :
Optical study of undoped, B or P-doped polysilicon
Thin Solid Films, Vol. 306, Iss. 1, 1997-08 ,pp. :