Influences of bias voltage on the crystallographic orientation of AlN thin films prepared by long-distance magnetron sputtering

Author: Chu A.K.   Chao C.H.   Lee F.Z.   Huang H.L.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.429, Iss.1, 2003-04, pp. : 1-4

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Abstract