Fracture toughness, adhesion and mechanical properties of low-K dielectric thin films measured by nanoindentation

Author: Volinsky A.A.   Vella J.B.   Gerberich W.W.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.429, Iss.1, 2003-04, pp. : 201-210

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Abstract