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Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. : 28-32

Elsevier

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Spectroscopic ellipsometry study of interfaces and crystallization behavior during annealing of a-Si:H films

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Thin Solid Films, Vol. 383, Iss. 1, 2001-02 ,pp. : 69-72

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Combining HW-CVD and PECVD techniques to produce a-Si:H films

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Atomic scale characterization of semiconductors by in-situ real time spectroscopic ellipsometry

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Real-time spectroscopic ellipsometry from 1.5 to 6.5 eV

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