Highly conducting doped poly-Si deposited by hot wire CVD and its applicability as gate material for CMOS devices

Author: Patil S.B.   Vairagar A.V.   Kumbhar A.A.   Sahu L.K.   Ramgopal Rao V.   Venkatramani N.   Dusane R.O.   Schroeder B.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.430, Iss.1, 2003-04, pp. : 63-66

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Abstract