Author: Rath J.K. Hardeman A.J. van der Werf C.H.M. van Veenendaal P.A.T.T. Rusche M.Y.S. Schropp R.E.I.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.430, Iss.1, 2003-04, pp. : 67-72
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Abstract
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