The influence of filament temperature on crystallographic properties of poly-Si films prepared by the hot-wire CVD method

Author: Lee J.C.   Kang K.H.   Kim S.K.   Yoon K.H.   Song J.   Park I.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.395, Iss.1, 2001-09, pp. : 188-193

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Abstract